We are compiling an embedded C++ application that is deployed in a shielded device in an environment bombarded with ionizing radiation. We are using GCC and cross-compiling
I've really read a lot of great answers!
Here is my 2 cent: build a statistical model of the memory/register abnormality, by writing a software to check the memory or to perform frequent register comparisons. Further, create an emulator, in the style of a virtual machine where you can experiment with the issue. I guess if you vary junction size, clock frequency, vendor, casing, etc would observe a different behavior.
Even our desktop PC memory has a certain rate of failure, which however doesn't impair the day to day work.